Blogs

Super speed analysis

Increased productivity of your engineers

Why communication is at the heart of yieldHUB

An intuitive yield management platform that was designed to remove silos and ensure engineers can collaborate easily.

Breaking bad habits in yield management

If you want to improve your yields along with your reputation, it’s time to break this bad habit and consider upgrading your system.

yieldHUB on the road in 2024

Discover yieldHUB’s highlights from 2024 from global semiconductor events to industry insights and key takeaways that shaped the year in yield management.

yieldHUB resolves customer return challenge

The following story highlights a key capability of yieldHUB that helped prevent a financial crisis that could have cost millions of dollars to the customer.

Why you should invest in a YMS before production

By establishing a solid infrastructure and training your workforce before production, your company can prepare for issues that arise during manufacturing.

It’s always about the yield

Whether it is the stock market or the semiconductor market, the name of the game is yield. In semiconductors, yield has to do with minimizing scrap costs in all phases of manufacturing.

Traceability: the secret to unlocking insights and enhanced chip performance

Traceability helps improve product quality and reduces DPPM (defective parts per million).

Benefits of an external yield management system

An innovative chip company recently spoke about why they chose an external Yield Management System (YMS) over developing their own product.

Why there is a growing interest in outlier detection

As automotive semiconductor companies strive to produce high-quality products, there is a growing interest in outlier detection.

The difference between a platform and a tool

In the world of yield management, two terms that are often used interchangeably are platform and tool, however, they are not the same.

Optimize sustainability with a yield management platform

By implementing sustainability initiatives, companies can reduce their environmental footprint and help to reduce the negative impact of their operations.

STDF: consistent format for storing test data

Overall, a consistent format for storing test data is essential for efficient and accurate test engineering. It also allows for the storage of large amounts of data, therefore, making it possible to track the performance of individual devices over time.

The problem with having too many yield management tools

Keeping countless systems requires more staff, resources and training. yieldHUB offers you an alternative. Streamline your yield management process, all in one hub.

NMI conference offers a sneak peek into the UK semiconductor industry's future

About the 2023 NMI conference, where the UK's semiconductor leaders meet to discuss everything from yield to the global market.

yieldHUB CEO: how I managed to build a company during one of the darkest periods for startups

The founder and CEO explained how he managed to overcome one of the toughest periods for businesses around the world.

Mental health awareness month: "Be aware of when you start to feel stressed"

Mental health issues can affect anyone no matter where they are in the world or what time of the year it is.

An introduction to STDF

STDF stands for “Standard Test Data Format” and it was originally developed between some of the largest test equipment vendors and semiconductor companies.

Image sensor yield management

Image sensor data relies heavily on images, but their large file sizes and multiple images per wafer cause data volumes to grow fast.

Are your yields too good to bother with a YMS?

High yields may seem reassuring, but hidden issues can still escape notice. Discover why a YMS matters even when your yields look “too good” to worry about.

6 signs you need to invest in a YMS

If analysis is slow, issues keep recurring, or data feels overwhelming, you may be overdue for a Yield Management System (YMS). Learn the top six indicators and what to do next.

Is industry consolidation driving improved quality in OSATs?

Discover why engineers moving to subcontract testing are seeing major improvements in operations and feedback.

How genealogy correlation can help your engineering teams

Genealogy correlation links yield, bins, and parameters across manufacturing stages. Learn how detecting issues early helps improve foundry control, boost yield and enhance product quality.

What's WAT? An overview of WAT/PCM data

Learn what Wafer Acceptance Testing (WAT) and Process Control Monitoring (PCM), really is.

How to sell a yield management platform to upper management

Pitching new software to management can be challenging. This guide walks you through how to make a compelling business case.

Automotive quality in consumer products

The shift has arrived: major consumer electronics companies are requiring automotive-level standards. Discover what this means for semiconductor suppliers and why quality expectations are rising.

4 essential tips when ramping up semiconductor production

Ramping up semiconductor production is challenging. Discover four essential tips to maintain quality, manage yield and scale efficiently during rapid growth.

How test development engineers can help product and sustaining engineering

Discover key insights from seasoned engineers on how test developers can better support product and sustaining teams during post-release debugging, even when resources are limited.

Should you build or buy a yield management system?

From airlines to construction, outsourcing is standard practice. Discover why fast-growing tech companies face the same decision with Yield Management Software and whether developing an in-house YMS truly makes sense.

Advice from product engineers to test engineers

What advice do product engineers have for test engineers? This blog highlights the most valuable insights and practical guidance shared by experts across the industry.

Reticle Analysis: Help rectify your yield

Learn how reticle analysis helps identify and prevent defects to protect semiconductor manufacturing performance.

What fabless startups should look for in a YMS

Choosing the right Yield Management System is critical for fabless startups. This guide covers the key features, capabilities, and support you should look for to scale efficiently.

Working from home: benefits and drawbacks for semiconductor engineers

Remote work is transforming engineering teams. This blog examines the advantages and drawbacks of working from home for semiconductor engineers, and how companies can balance both.

Building remote teams: the engineer’s guide

Learn how engineering leaders can build effective remote teams, from communication and culture to workflow design and collaboration tools.

Rubbish datalogs may not be rubbish afterall

Not all messy datalogs should be thrown away. Trial runs and QA retests often reveal what really happened during subcon testing. Discover why preserving these records can provide critical engineering insights.

Making your test house your test home

Discover how yieldHUB enables test houses to differentiate themselves by offering customers a private cloud platform for automated reports, alerts, and collaborative yield and quality analysis.

Standardising STDF metadata

Learn how yieldHUB supports engineers by detecting, correcting, and managing these critical data issues.

5 important tips for working with STDF

STDF is the semiconductor industry’s standard datalog format, but processing these files can introduce errors. This blog covers five key issues to watch for to ensure accurate, reliable data when analyzing STDF files.

Covid-19: how semiconductor professionals are dealing with the virus

Explore how semiconductor professionals adapted to the challenges of Covid-19. From remote work and travel restrictions to safeguarding production and supporting global supply chains.

Getting beyond test names: Help sustaining engineers debug more quickly

Discover how moving beyond basic test names and improving clarity in test metadata can help sustaining engineers debug issues faster and reduce time-to-resolution.

Cleaning data for final test

Watch our webinar about the important of data cleansing for final test.

The insider’s guide to great online meetings

This insider’s guide shares best practices for hosting great online meetings, from preparation and communication to keeping participants focused and involved.

Analysing STDF data from Home

STDF files can reach gigabyte sizes, making remote analysis slow and cumbersome. This blog explores the challenges of downloading and reviewing large datasets from home and why handling dozens of files can delay issue resolution.

Common issues with automated STDF data upload

Moving STDF files into an automated yield management database boosts efficiency but requires careful planning. This article outlines the essential pitfalls and technical factors to watch for during implementation.

Using big data for yield and reliability

In this webinar yieldHUB Founder & CEO John O’Donnell covers a key topic: big data for yield and reliability.

Cradle to the grave

Semiconductor data is living longer than ever. In this blog, yieldHUB CEO John O’Donnell explores how product traceability, end-of-life returns, and rising reliability standards are reshaping how engineers learn from long-term device performance.

Discover the advantages of gage R&R

Explore how gage R&R can help your engineering team make strides in yield improvement.

Wafer probe floors: recover your UPH!

UPH and recovery rate can be tracked automatically and having them available for engineers will lead to efficient reprobe and UPH improvement

Test environment gage R&R: ramp your multi-site test yield faster

If your yield ramp-up of multi-site testing is not looking smooth in initial production then yieldHUB’s Gage R&R V3 is there to help you.

Save hours every time instead of using desktop tools

Using spreadsheets and desktop tools isn't sustainable long term. Here's why.

8 reasons to choose the cloud for semiconductor yield management

From security to scalability, there is a reason why more and more semiconductor companies are opting for cloud when it comes to yield management.

Increasing your chances of a successful feature request!

Here's your go-to guide to managing queries with your software providers.

Editing STDF and text datalogs: is this a safe practice in production?

Discover why modifying these files can be risky and what factories should consider before allowing edits.

NPI webinar

Learn how to streamline product release, ensure consistent yields, and eliminate spreadsheet-driven errors in this focused 30-minute webinar for engineers and managers.

Our top tips and tricks for engineers: revising test programs

ATE test programs need regular updates. Learn why these changes are essential and how to manage them effectively.

Figuring out binary datalog formats without a spec

Discover how we transformed a manual, time intensive task into an efficient, scalable solution for analyzing historical semiconductor data.

Who should control part average testing?

Learn why fabless companies are shifting responsibility in-house and explore the fundamentals of outlier detection and PAT.

The three different types of data manipulation

Explore the three levels of data manipulation such as manual, semi-automated, and fully automated, and learn how each impacts efficiency.

Effective semiconductor yield management: 8 key questions

Learn how even small yield gains translate into major financial impact and why a robust yield information system is essential for fast, data driven decision making.

The excitement in finding the root cause of yield loss

Learn how data-driven methods like long-term trend analysis, wafer map stacking, and genealogy correlation can uncover issues in hours, not days, and why effective yield management is critical across the industry.

The hidden potential of test engineers

Test engineers play a critical but often overlooked role in semiconductor success. While design teams shape the product, test engineers safeguard quality, prevent defective devices from reaching customers, and hold untapped potential to boost revenue. Learn how their work directly impacts the bottom line.

A test program never refused tests

Discover simple, high impact ways to reduce semiconductor test time and learn about how consolidating all your data into a fast, accessible database can become easy wins for your engineering team.

Why should OSATs work with yieldHUB?

Learn about our yield management solutions, including NPI support, characterization tools and gage R&R.

Are you ready for the holistic YMS approach?

With insights from semiconductor expert André van de Geijn, learn the key pillars to consider when evaluating a yield management system and why looking beyond immediate problems delivers long-term value.

Test Engineers: Understand your impact

Discover how test engineers can reshape their role, build confidence, increase visibility, and elevate their value through smarter testing practices and continuous professional development.

Do you need support for your software?

Compare the risks and benefits of single-version software, in-house development and Software as a Service. Learn how each model impacts support, scalability, and long-term reliability, plus why SaaS often offers the lowest overall risk.

Are lots on hold holding you back?

Learn what causes lots on hold and discover practical ways to streamline investigations, reduce delays and improve on-time delivery for your customers.

Dealing with large STDF data sets

Former test engineer and yieldHUB Founder and CEO John O’Donnell reflects on the challenges of analyzing large STDF datasets and how modern, server-powered yield management tools now enable engineers to process gigabytes of data in seconds, saving time, improving insight and transforming engineering productivity.

Do you pay too much to have your products tested?

How one fabless semiconductor company uncovered hidden test inefficiencies at their subcon and how automated reporting of UPH, test time and index time in yieldHUB now gives them full visibility, reduces costs and drives better collaboration and throughput across all test partners.

STDF datalog analysis: Taking re-screen into account

Learn how automated datalog consolidation in yieldHUB ensures accurate lot-level yield reporting by interpreting run types, combining parametric and bin data, and managing re-screen logic.

The benefits of having a yield analysis solution which offers scheduled reports

Learn about the advantages of having scheduled reports from a customer. yieldHUB offers an automated and seamless system so you can easily access reports and share these with your team and even management.

Analyzing STDF data? Learn how test numbers improve productivity

Learn why unique and consistent test numbers in STDF files are crucial for accurate semiconductor yield analysis.

Improving STDF processing into a database

Discover why STDF datalogs must be transformed into a reporting-optimized database structure for efficient semiconductor yield analysis.