Trusted by the industry. Proven results.

Dealing with huge volumes of data

It is common to have >1TB of STDF data needing monitoring and analysis. Scalability with clever yieldHUB database design is key.

  • A system that can handle a few gigabytes of data to terabytes, and everything in between

  • Analyse millions of units quickly so you can keep pace with fast consumer electronics cycles

  • Scale without limits. With us your analysis stays smooth, stable and effortless

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Hard to see anomalies in time

With such high volumes, a system like yieldHUB is a great help with parametric, bin and yield alerts available.

  • Automated alerts help you make confident decisions instead of sifting through mountains of data

  • Catch the earliest warning signs so small issues never escalate into costly returns or field failures

  • Early anomaly detection protects not just your yield, but your reputation in a competitive market

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Test time

yieldHUB treats test time like a test. This means you will be able to analyse it comprehensively to reduce it over time and save cost.

  • Identify bottlenecks so your existing testers deliver more units per hour, without added capital cost

  • With clear visibility into test-time drivers, your team can stop guessing and start optimizing

  • Small time savings can have impact when you're shipping in the millions, driving stronger margins

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Hidden failure patterns

The ability to quickly stack hundreds of wafers and see the yield at each x/y reveals patterns helping your foundry improve your yield.

  • Spot subtle spatial patterns that would normally stay buried

  • Achieve a more predictable supply chain with clear insight into the true source of every issue

  • Spotting hidden failure patterns early reduces debug cycles, helping you get consumer products into hands faster

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Yield Consistency via Gage R&R

Gage R&R has been used for many years in the semiconductor industry to measure variation during test for repeatability and reproducibility. These measurements are then used to assess the suitability of the test for production.

  • Reliable test setups mean you can ramp up faster, without worrying about false fails

  • When every tester is validated the same way, cross-site discrepancies disappear, saving hours of diagnostics

  • Consistent, trustworthy measurement ensures only truly good units ship, reducing the risk of returns

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Site issues

With multi-site testing very common for high volume chips, yieldHUB has all the site based analysis you need to optimise yield across sites.

  • Site health monitoring and alerts with yieldHUB's real-time test floor monitoring platform

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Top semiconductor companies choose yieldHUB

“ Days of effort that were required before we had yieldHUB have now been eliminated."

EdgeQ

Data extraction is a breeze

“ I am happy with the speed, and the amount of data yieldHUB is capable of managing."

Ambiq

Speed & scalability

“ Our test yield has become better through proactive Fab improvement and shorter feedback time from the Fab and test house."

TDK

Faster fab improvement

“ The charts and graphs make it easy to identify problems and their causes. It makes my job easier. The team is happier and more productive."

Microchip

Diverse analysis

“ I like the system for its ability to be a one-stop shop for data review, statistical analysis, and reporting."

Infineon

With yieldHUB, we can identify and solve problems.

“ I am impressed by the remarkable speed yieldHUB processes large datasets"

Test Development Engineer, EnSilica

Masters the big data problem

“ yieldHUB’s system is very fast and processes vast amounts of data within minutes."

ADTechnology Inc

10 times more efficient

“ yieldHUB certainly masters the ‘big data’ problem."

Test Development Engineer, EnSilica

Fast big data processing & Cp/Cpk yield optimization

“ The best combination of production visibility and intuitive design."

VP Product & Test Engineering, Movandi

Production visibility, usability, & scalability

“ Their big data software and worldwide support has allowed us to manage our yields effectively."

VP Corporate Operations, Diodes

Big data scalability & responsive support

“ I am able to do extremely detailed analysis very quickly."

Principal Product Engineer, Xaar

Fast, detailed silicon variation analysis

“ yieldHUB makes my team 10 times more efficient."

Principal Engineer - Test Development, ADTechnology Inc

Quicker STDF processing time

“ It has the feel of being a customised tool."

VP Manufacturing & Quality, Decawave (Now Qorvo)

Flexible to support manufacturing challenges

“ With a simple click, it can take you all the way down to a single die."

Director of Product & Quality Engineering, Cambridge GaN Devices

Die-level correlation across stages

“ We were able to improve the yield by 4% and it’s now very stable."

Product Development Manager, EnSilica

Improved yield & stabilized ramp

“ I can identify problems in just one minute."

Principal Engineer - Test Development, ADTechnology Inc

Rapid root cause identification

“ yieldHUB plays a very important daily role in our PE and QE teams."

Director of Product & Quality Engineering, Cambridge GaN Devices

Used daily in PE & QE teams

“ You can log in from any web browser and do loads of data correlations."

Director of Product & Quality Engineering, Cambridge GaN Devices

Browser-based

“ I like the system for its ability to be a one-stop shop for data review, statistical analysis, and reporting."

Product Engineering Manager, Infineon

Consolidates data review, analysis, & reporting in one system

“ yieldHUB increased productivity 60 times in that case."

Product Engineering Manager, Infineon

Reduced analysis time from hours to minutes.

“ It’s much faster typically in yieldHUB."

Product Engineer, Movandi

Accelerates routine production yield investigations

“ With yieldHUB it’s easy to connect the chip data to the module data."

Product Engineer, Movandi

End-to-end traceability

“ We are extremely pleased with yieldHUB and its ability to cope with our high production volume."

Engineer, Raspberry Pi

Handles high-volume production data

“ Something that’s very helpful to us is the ability within yieldHUB to click and drill down, by test or by part."

Engineer, Raspberry Pi

Enables fast drill-down

“ It’s helped us to beat our turnaround time in development."

Test Engineer, Boréas Technologies

Improved development speed and time-to-market.

“ Your customer service has always been perfect."

Test Engineer, Boréas Technologies

Highly responsive support

“ It must be in one well-integrated system where you can run correlation at different stages."

Director of Product & Quality Engineering, Cambridge GaN Devices

Correlation across production stages

“ yieldHUB has been organized quite well and it’s easy to use."

Director of Product & Quality Engineering, Cambridge GaN Devices

User-friendly design

“ We need to drill down to the site level detail to see if the spec requirements are well met."

Director of Product & Quality Engineering, Cambridge GaN Devices

Enables detailed site-level performance validation before assembly.

“ In case of any fab issue, then you can contact the Foundry guys and share the data."

Director of Product & Quality Engineering, Cambridge GaN Devices

Foundry collaboration

“ yieldHUB enabled us to aggregate all collected data quickly and visualize the data in one place."

Senior Manager of Product Engineering, Ambiq

Multi-OSAT data consolidation

“ yieldHUB’s speed and scalability have been impressive."

Senior Manager of Product Engineering, Ambiq

Years of data, Die-level visibility

“ The genealogy correlation enables me to notice any issue as it happened."

Senior Manager of Product Engineering, Ambiq

End-to-end traceability

“ yieldHUB has made my job much easier by linking wafer fab data all the way to final test."

Senior Manager of Product Engineering, Ambiq

Fab-to-final-test linkage

“ Data extraction is a breeze."

Director of Product & Test Engineering, EdgeQ

Automated OSAT uploads

“ Days of effort that were required before we had yieldHUB have now been eliminated."

Director of Product & Test Engineering, EdgeQ

Manual data crunching removed

“ The platform is simple to use to extract data from any tests."

Director of Product & Test Engineering, EdgeQ

Statistical limits & graphical summaries

“ We have greatly exceeded our goals in a shorter time frame than expected."

VP of Quality, Integra Technologies

ROI exceeded & statistical yield limits deployed

“ We were able to reduce average cycle times by over 70%."

VP of Quality, Integra Technologies

70% cycle time reduction

“ Our test yield has become better through proactive Fab improvement."

Chief Project Engineer, TDK

SYL & SBL deployment

“ It absolutely saves us time"

Chief Project Engineer, TDK

Automated abnormality detection

“ yieldHUB coped with over 20 million units in our first year of production."

Engineer, Raspberry Pi

20M+ units & high-volume production

“ yieldHUB has made my job much easier by linking wafer fab data all the way to final test."

Senior Manager of Product Engineering, Ambiq

Fab-to-final-test genealogy correlation

“ yieldHUB allows you to upgrade as your product volume scales up."

Director of Product & Quality Engineering, Cambridge GaN Devices

Supports growth from NPI to high-volume production

“ Our test yield has become better through proactive Fab improvement."

Chief Project Engineer, TDK

Improved test yield through structured statistical limits and Fab collaboration

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