Frequently Asked Questions

yieldHUB combines powerful semiconductor yield analytics with a fast, intuitive user experience and strong customer support. Customers value our collaborative tools, which help global teams investigate yield issues together, as well as our rapid deployment model, which gets teams up and running in days or weeks rather than months. They also choose yieldHUB for high-speed data analysis across large manufacturing datasets.

yieldHUB ingests semiconductor test and manufacturing data into a centralized platform where it can be structured, analyzed, and monitored. Data files generated from testers, typically STDF along with more than 100 other supported formats, are processed into the database and made available through a wide range of yield and test analytics tools. The platform can also generate automated reports and alerts based on production data.

Yes. Test data generated from semiconductor testers is the main input into yieldHUB. The platform automatically ingests and processes this data so it can be analyzed across wafers, lots, products, and production sites.

yieldHUB ingests data from semiconductor testers, wafer probers, and wafer acceptance testing (WAT) from fabs. This allows data from multiple manufacturing stages to be correlated and analyzed in one platform.

yieldHUB supports more than 100 data formats used across semiconductor manufacturing. Common formats include STDF, CSV, log files, and WAT data from a wide range of fabs.

yieldHUB uses strong security practices including two-factor authentication for user access and backend security and threat monitoring. For cloud deployments, yieldHUB uses AWS infrastructure, which provides enterprise-grade encryption, network security, and highly secure data center environments. We support all cloud platforms.

yieldHUB is provided through a software license model with flexible deployment options. Customers can choose cloud-hosted or on-premise deployment depending on their operational, IT, and security requirements.

Yes. yieldHUB includes an automated data pipeline that ingests, cleanses, and monitors incoming production data. The platform can automatically generate exception alerts when anomalies or yield issues are detected, allowing engineers to investigate root causes quickly.

Yes. yieldHUB includes onboarding as part of the service, including system setup and training tailored to customer requirements. This helps teams get value quickly and supports faster adoption across engineering and manufacturing groups.

Yes. All yieldHUB users have access to comprehensive online help, including training videos and detailed guidance covering many of the platform’s tools and features.

yieldHUB supports very large datalogs. Some customers analyze more than 20,000 tests in a single datalog, and we have not encountered an upper system limit.

Yes. yieldHUB supports data from modules and systems as well as wafer and device-level test. This allows customers to analyze data across broader production and product flows.

Yes. yieldHUB can generate Highest Correlations reports from any datalog, helping engineers see which tests correlate most strongly with each other or with a selected test. This is especially useful when looking for opportunities to reduce redundant testing and save test time.

Yes. yieldHUB supports OTP and Fuse ID data for traceability, helping customers connect test and manufacturing data at a more granular level.

Yes. yieldHUB can integrate with existing Manufacturing Execution Systems (MES) to ingest production data and correlate it with wafer, probe, assembly, and final test data. This allows engineering and operations teams to analyze manufacturing performance across multiple systems without replacing existing infrastructure.

Yes. yieldHUB provides APIs that allow integration with MES, ERP, and other manufacturing systems. APIs can also enable automated workflows such as triggering alerts, sending signals to external systems, or integrating yield analytics into broader manufacturing dashboards.

Yes. yieldHUB supports both cloud deployment and on-premise installations depending on customer security, IT, and operational requirements.

Yes. yieldHUB provides the data infrastructure and analytics foundation required for advanced analysis and AI.

Yes. yieldHUB correlates data across multiple manufacturing stages, including wafer probe, assembly, and final test. This enables engineers to identify upstream causes of downstream yield or performance issues.

Yes. yieldHUB can monitor incoming production data and generate real-time alerts when yield shifts, parametric drift, or other anomalies are detected.

Yes. yieldHUB can enable operational responses, such as stopping a handler or prober when significant yield or parametric issues are detected.

Yes. yieldHUB supports configurable statistical process control (SPC) rules. Users can define rules and thresholds that trigger alerts, reports, or automated workflows when specific conditions are detected in production data.