Problems we solve for computer and peripheral equipment
Companies need a yield management system to monitor chip manufacture status, including foundry wafer electrical parameters, wafer sort binning and final package chip results to make sure your products meet the quality and performance requirements.
Automated cleansing of data
Clean manufacturing datalogs automatically for faster, more reliable yield analysis.
Foundry collaboration
Share data with foundry partners to accelerate yield improvement.
Cross-stage correlations
Link WAT, wafer sort & final test data to identify process variation affecting yield.
Virtual wafer retest
Apply new limits to previously tested wafers without rerunning tests.
Site analysis
Identify tester and site variation affecting yield.
Hidden failure patterns
Stack wafers to reveal spatial yield patterns across X/Y locations.
Trusted by the industry. Proven in production.
Data extraction is a breeze
“ I am happy with the speed, and the amount of data yieldHUB is capable of managing."
AmbiqSpeed & scalability
“ Our test yield has become better through proactive Fab improvement and shorter feedback time from the Fab and test house."
TDKFaster fab improvement
“ The charts and graphs make it easy to identify problems and their causes. It makes my job easier. The team is happier and more productive."
MicrochipDiverse analysis
“ I like the system for its ability to be a one-stop shop for data review, statistical analysis, and reporting."
InfineonWith yieldHUB, we can identify and solve problems.
“ I am impressed by the remarkable speed yieldHUB processes large datasets"
Test Development Engineer, EnSilicaMasters the big data problem
“ yieldHUB’s system is very fast and processes vast amounts of data within minutes."
ADTechnology Inc10 times more efficient
“ yieldHUB certainly masters the ‘big data’ problem."
Test Development Engineer, EnSilicaFast big data processing & Cp/Cpk yield optimization
“ The best combination of production visibility and intuitive design."
VP Product & Test Engineering, MovandiProduction visibility, usability, & scalability
“ Their big data software and worldwide support has allowed us to manage our yields effectively."
VP Corporate Operations, DiodesBig data scalability & responsive support
“ I am able to do extremely detailed analysis very quickly."
Principal Product Engineer, XaarFast, detailed silicon variation analysis
“ yieldHUB makes my team 10 times more efficient."
Principal Engineer - Test Development, ADTechnology IncQuicker STDF processing time
“ It has the feel of being a customised tool."
VP Manufacturing & Quality, Decawave (Now Qorvo)Flexible to support manufacturing challenges
“ With a simple click, it can take you all the way down to a single die."
Director of Product & Quality Engineering, Cambridge GaN DevicesDie-level correlation across stages
“ We were able to improve the yield by 4% and it’s now very stable."
Product Development Manager, EnSilicaImproved yield & stabilized ramp
“ I can identify problems in just one minute."
Principal Engineer - Test Development, ADTechnology IncRapid root cause identification
“ yieldHUB plays a very important daily role in our PE and QE teams."
Director of Product & Quality Engineering, Cambridge GaN DevicesUsed daily in PE & QE teams
“ You can log in from any web browser and do loads of data correlations."
Director of Product & Quality Engineering, Cambridge GaN DevicesBrowser-based
“ I like the system for its ability to be a one-stop shop for data review, statistical analysis, and reporting."
Product Engineering Manager, InfineonConsolidates data review, analysis, & reporting in one system
“ yieldHUB increased productivity 60 times in that case."
Product Engineering Manager, InfineonReduced analysis time from hours to minutes.
“ It’s much faster typically in yieldHUB."
Product Engineer, MovandiAccelerates routine production yield investigations
“ With yieldHUB it’s easy to connect the chip data to the module data."
Product Engineer, MovandiEnd-to-end traceability
“ We are extremely pleased with yieldHUB and its ability to cope with our high production volume."
Engineer, Raspberry PiHandles high-volume production data
“ Something that’s very helpful to us is the ability within yieldHUB to click and drill down, by test or by part."
Engineer, Raspberry PiEnables fast drill-down
“ It’s helped us to beat our turnaround time in development."
Test Engineer, Boréas TechnologiesImproved development speed and time-to-market.
“ Your customer service has always been perfect."
Test Engineer, Boréas TechnologiesHighly responsive support
“ It must be in one well-integrated system where you can run correlation at different stages."
Director of Product & Quality Engineering, Cambridge GaN DevicesCorrelation across production stages
“ yieldHUB has been organized quite well and it’s easy to use."
Director of Product & Quality Engineering, Cambridge GaN DevicesUser-friendly design
“ We need to drill down to the site level detail to see if the spec requirements are well met."
Director of Product & Quality Engineering, Cambridge GaN DevicesEnables detailed site-level performance validation before assembly.
“ In case of any fab issue, then you can contact the Foundry guys and share the data."
Director of Product & Quality Engineering, Cambridge GaN DevicesFoundry collaboration
“ yieldHUB enabled us to aggregate all collected data quickly and visualize the data in one place."
Senior Manager of Product Engineering, AmbiqMulti-OSAT data consolidation
“ yieldHUB’s speed and scalability have been impressive."
Senior Manager of Product Engineering, AmbiqYears of data, Die-level visibility
“ The genealogy correlation enables me to notice any issue as it happened."
Senior Manager of Product Engineering, AmbiqEnd-to-end traceability
“ yieldHUB has made my job much easier by linking wafer fab data all the way to final test."
Senior Manager of Product Engineering, AmbiqFab-to-final-test linkage
“ Data extraction is a breeze."
Director of Product & Test Engineering, EdgeQAutomated OSAT uploads
“ Days of effort that were required before we had yieldHUB have now been eliminated."
Director of Product & Test Engineering, EdgeQManual data crunching removed
“ The platform is simple to use to extract data from any tests."
Director of Product & Test Engineering, EdgeQStatistical limits & graphical summaries
“ We have greatly exceeded our goals in a shorter time frame than expected."
VP of Quality, Integra TechnologiesROI exceeded & statistical yield limits deployed
“ We were able to reduce average cycle times by over 70%."
VP of Quality, Integra Technologies70% cycle time reduction
“ Our test yield has become better through proactive Fab improvement."
Chief Project Engineer, TDKSYL & SBL deployment
“ It absolutely saves us time"
Chief Project Engineer, TDKAutomated abnormality detection
“ yieldHUB coped with over 20 million units in our first year of production."
Engineer, Raspberry Pi20M+ units & high-volume production
“ yieldHUB has made my job much easier by linking wafer fab data all the way to final test."
Senior Manager of Product Engineering, AmbiqFab-to-final-test genealogy correlation
“ yieldHUB allows you to upgrade as your product volume scales up."
Director of Product & Quality Engineering, Cambridge GaN DevicesSupports growth from NPI to high-volume production
“ Our test yield has become better through proactive Fab improvement."
Chief Project Engineer, TDKImproved test yield through structured statistical limits and Fab collaboration
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