Trusted by the industry. Proven results.

Built for zero-defect and mission-critical environments

High reliability semiconductor manufacturing spans automotive, aerospace, defence, space and medical programmes where failure is not an option. yieldHUB supports qualification and production under AEC-Q100/101/102, ISO 26262, IATF 16949, MIL-STD-883, MIL-PRF-38535, NASA EEE-INST-002 and related frameworks.

  • Support for PPAP, APQP and control plan validation

  • Zero PPM, DPPM and FIT rate monitoring

  • ELFR detection and drift tracking during burn-in and HTOL

  • Lot norm and part average testing (DPAT / SPAT)

  • Designed to support QML-level discipline

Audit-ready traceability across the full lifecycle

High reliability programmes require complete genealogy, export-controlled access and decades-long retention. yieldHUB is audit-ready by design, providing the traceability and governance required for defence, space and safety-critical semiconductor manufacturing.

  • Full wafer lot, wafer ID and XY traceability

  • Device-level genealogy from fab to final test and module

  • Serialised lookup for RMA and customer returns

  • Complete audit trail of data edits and adjustments

  • Long-term archival aligned to defence and space lifecycles

  • Support for ITAR- and EAR-controlled environments

The analytics backbone behind qualification

Qualification data must be analysed with precision before release into mission-critical applications. yieldHUB centralises qualification datasets and delivers population-level and die-level insight across environmental and reliability stress testing.

  • Burn-in, HTOL and life-test drift analysis

  • Mission profile and stress condition correlation

  • Gage R&R for multi-site validation

  • HALT and HASS dataset analysis

  • Parametric stability validation prior to release

  • Radiation dataset support including TID and single event monitoring

Advanced anomaly detection for zero-defect strategy

Subtle parametric shifts and lot anomalies can become catastrophic field failures. yieldHUB automatically detects outliers and abnormal behaviour using aerospace- and automotive-grade statistical methods.

  • Dynamic and static part average testing (DPAT / SPAT)

  • Good die in bad neighbourhood (GDBN) analysis

  • Multi-lot and within-lot lot norm detection

  • Statistical bin limit enforcement

  • Automated parametric and bin outlier monitoring

  • Custom reliability screening algorithms

Automated data cleansing for regulated environments

High reliability manufacturing cannot tolerate inconsistent or fragmented datasets. yieldHUB automatically cleanses, aligns and validates manufacturing and test data before analysis, ensuring engineering decisions are based on trustworthy information.

  • Automated consolidation of multiple datalogs

  • Cleansing of re-screen and retest flows

  • Standardisation of STDF, WAT and custom formats

  • Elimination of manual spreadsheet manipulation

  • Reliable datasets for audit and qualification reviews

Correlation across the entire manufacturing flow

Understanding how fab parameters influence wafer sort, final test and reliability outcomes is essential for high reliability semiconductor manufacturing. yieldHUB ties process, assembly and test together in one system.

  • Cross-stage correlation from WAT to final test

  • Program revision and limit change detection

  • Multi-die and module-level analysis

  • Site-to-site comparison for controlled environments

  • Shared dashboards for quality and reliability leadership

Automated inspection and defect intelligence

In high reliability assembly and packaging, inspection quality is critical. yieldHUB supports automated AI image classification workflows, reducing manual burden while preserving human oversight for complex decisions.

  • Automated X-ray inspection classification

  • AI-assisted defect sorting

  • Human-in-the-loop workflow for uncertain cases

  • Reduced manual inspection time

  • Structured defect data linked to yield analytics

Real-time visibility and controlled collaboration

High reliability programmes require disciplined yet responsive decision making. yieldHUB transforms millions of data points into real-time dashboards and controlled collaboration environments for global teams.

  • Real-time dashboards and alerting

  • Controlled access by role and programme

  • Secure collaboration across fabs, OSATs and partners

  • Shared investigation workflows for corrective action

  • Infrastructure available on-premise or secure AWS cloud

When compliance is only the baseline

Meeting AEC-Q, MIL-STD, ISO 26262, IATF 16949, ITAR or QML expectations is only the starting point. True high reliability semiconductor manufacturing demands statistical discipline, anomaly detection and audit-ready traceability across the full lifecycle. yieldHUB delivers the analytics backbone behind qualification, the traceability platform for audits and returns, and the anomaly detection engine required to protect mission-critical semiconductor programmes.

Top semiconductor companies choose yieldHUB

“ Days of effort that were required before we had yieldHUB have now been eliminated."

EdgeQ

Data extraction is a breeze

“ I am happy with the speed, and the amount of data yieldHUB is capable of managing."

Ambiq

Speed & scalability

“ Our test yield has become better through proactive Fab improvement and shorter feedback time from the Fab and test house."

TDK

Faster fab improvement

“ The charts and graphs make it easy to identify problems and their causes. It makes my job easier. The team is happier and more productive."

Microchip

Diverse analysis

“ I like the system for its ability to be a one-stop shop for data review, statistical analysis, and reporting."

Infineon

With yieldHUB, we can identify and solve problems.

“ I am impressed by the remarkable speed yieldHUB processes large datasets"

Test Development Engineer, EnSilica

Masters the big data problem

“ yieldHUB’s system is very fast and processes vast amounts of data within minutes."

ADTechnology Inc

10 times more efficient

“ yieldHUB certainly masters the ‘big data’ problem."

Test Development Engineer, EnSilica

Fast big data processing & Cp/Cpk yield optimization

“ The best combination of production visibility and intuitive design."

VP Product & Test Engineering, Movandi

Production visibility, usability, & scalability

“ Their big data software and worldwide support has allowed us to manage our yields effectively."

VP Corporate Operations, Diodes

Big data scalability & responsive support

“ I am able to do extremely detailed analysis very quickly."

Principal Product Engineer, Xaar

Fast, detailed silicon variation analysis

“ yieldHUB makes my team 10 times more efficient."

Principal Engineer - Test Development, ADTechnology Inc

Quicker STDF processing time

“ It has the feel of being a customised tool."

VP Manufacturing & Quality, Decawave (Now Qorvo)

Flexible to support manufacturing challenges

“ With a simple click, it can take you all the way down to a single die."

Director of Product & Quality Engineering, Cambridge GaN Devices

Die-level correlation across stages

“ We were able to improve the yield by 4% and it’s now very stable."

Product Development Manager, EnSilica

Improved yield & stabilized ramp

“ I can identify problems in just one minute."

Principal Engineer - Test Development, ADTechnology Inc

Rapid root cause identification

“ yieldHUB plays a very important daily role in our PE and QE teams."

Director of Product & Quality Engineering, Cambridge GaN Devices

Used daily in PE & QE teams

“ You can log in from any web browser and do loads of data correlations."

Director of Product & Quality Engineering, Cambridge GaN Devices

Browser-based

“ I like the system for its ability to be a one-stop shop for data review, statistical analysis, and reporting."

Product Engineering Manager, Infineon

Consolidates data review, analysis, & reporting in one system

“ yieldHUB increased productivity 60 times in that case."

Product Engineering Manager, Infineon

Reduced analysis time from hours to minutes.

“ It’s much faster typically in yieldHUB."

Product Engineer, Movandi

Accelerates routine production yield investigations

“ With yieldHUB it’s easy to connect the chip data to the module data."

Product Engineer, Movandi

End-to-end traceability

“ We are extremely pleased with yieldHUB and its ability to cope with our high production volume."

Engineer, Raspberry Pi

Handles high-volume production data

“ Something that’s very helpful to us is the ability within yieldHUB to click and drill down, by test or by part."

Engineer, Raspberry Pi

Enables fast drill-down

“ It’s helped us to beat our turnaround time in development."

Test Engineer, Boréas Technologies

Improved development speed and time-to-market.

“ Your customer service has always been perfect."

Test Engineer, Boréas Technologies

Highly responsive support

“ It must be in one well-integrated system where you can run correlation at different stages."

Director of Product & Quality Engineering, Cambridge GaN Devices

Correlation across production stages

“ yieldHUB has been organized quite well and it’s easy to use."

Director of Product & Quality Engineering, Cambridge GaN Devices

User-friendly design

“ We need to drill down to the site level detail to see if the spec requirements are well met."

Director of Product & Quality Engineering, Cambridge GaN Devices

Enables detailed site-level performance validation before assembly.

“ In case of any fab issue, then you can contact the Foundry guys and share the data."

Director of Product & Quality Engineering, Cambridge GaN Devices

Foundry collaboration

“ yieldHUB enabled us to aggregate all collected data quickly and visualize the data in one place."

Senior Manager of Product Engineering, Ambiq

Multi-OSAT data consolidation

“ yieldHUB’s speed and scalability have been impressive."

Senior Manager of Product Engineering, Ambiq

Years of data, Die-level visibility

“ The genealogy correlation enables me to notice any issue as it happened."

Senior Manager of Product Engineering, Ambiq

End-to-end traceability

“ yieldHUB has made my job much easier by linking wafer fab data all the way to final test."

Senior Manager of Product Engineering, Ambiq

Fab-to-final-test linkage

“ Data extraction is a breeze."

Director of Product & Test Engineering, EdgeQ

Automated OSAT uploads

“ Days of effort that were required before we had yieldHUB have now been eliminated."

Director of Product & Test Engineering, EdgeQ

Manual data crunching removed

“ The platform is simple to use to extract data from any tests."

Director of Product & Test Engineering, EdgeQ

Statistical limits & graphical summaries

“ We have greatly exceeded our goals in a shorter time frame than expected."

VP of Quality, Integra Technologies

ROI exceeded & statistical yield limits deployed

“ We were able to reduce average cycle times by over 70%."

VP of Quality, Integra Technologies

70% cycle time reduction

“ Our test yield has become better through proactive Fab improvement."

Chief Project Engineer, TDK

SYL & SBL deployment

“ It absolutely saves us time"

Chief Project Engineer, TDK

Automated abnormality detection

“ yieldHUB coped with over 20 million units in our first year of production."

Engineer, Raspberry Pi

20M+ units & high-volume production

“ yieldHUB has made my job much easier by linking wafer fab data all the way to final test."

Senior Manager of Product Engineering, Ambiq

Fab-to-final-test genealogy correlation

“ yieldHUB allows you to upgrade as your product volume scales up."

Director of Product & Quality Engineering, Cambridge GaN Devices

Supports growth from NPI to high-volume production

“ Our test yield has become better through proactive Fab improvement."

Chief Project Engineer, TDK

Improved test yield through structured statistical limits and Fab collaboration

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