In production at fabless companies, IDMs and OSATs worldwide • 60B+ chips analyzed a year • 5 star rating customer satisfaction
Better data. Better yield control.
One database for fab, wafer sort, probe and final test data in any format, STDF to raw tester logs, across every subcon and site. No more stitching spreadsheets.
One standard for yield reporting across every product, subcon and site. The executive review matches the test floor. Infineon cut analysis time from hours to minutes.
Die-level genealogy links any final test failure to its wafer, die position and process history. Answer customer returns in minutes, not weeks.
yieldHUB Live puts AI on the test floor: yield, bins, drift and tester OEE tracked as lots run, with alerts while the lot is still on the handler.
Turn semiconductor data into measurable production gains
Up to 20% Higher yield
Across ramp and production. More good die per wafer.
90% Quality Improvement
Catch issues before they escape and drive costly failures. Cycle times cut over 70% at Integra.
90% Reliability Improvement
Time saved in customer return analysis. 20M+ units traced in year one.
Up to 96% Engineering Efficiency
Time saved on lot analysis and test parameter correlation.
Solve semiconductor yield challenges faster
Increase yield confidently with trusted data
Identify test issues early
Focus effort with Pareto insights
Monitor yield, bins and parameters in real time
Cut test costs via OEE optimization
Characterize products at scale
Detect outliers early, reduce returns
Accelerate die level root-cause
Resolve returns with full traceability
Accelerate first silicon learning
Gain immediate yield visibility, identify test issues early, and accelerate learning from first silicon.
