“ Days of effort that were required before we had yieldHUB have now been eliminated."
EdgeQ Data extraction is a breeze
“ I am happy with the speed, and the amount of data yieldHUB is capable of managing."
Ambiq
“ Our test yield has become better through proactive Fab improvement and shorter feedback time from the Fab and test house."
TDK
“ The charts and graphs make it easy to identify problems and their causes. It makes my job easier. The team is happier and more productive."
Microchip
“ I like the system for its ability to be a one-stop shop for data review, statistical analysis, and reporting."
Infineon With yieldHUB, we can identify and solve problems.
“ I am impressed by the remarkable speed yieldHUB processes large datasets"
Test Development Engineer, EnSilica Masters the big data problem
“ yieldHUB’s system is very fast and processes vast amounts of data within minutes."
ADTechnology Inc
“ yieldHUB certainly masters the ‘big data’ problem."
Test Development Engineer, EnSilica Fast big data processing & Cp/Cpk yield optimization
“ The best combination of production visibility and intuitive design."
VP Product & Test Engineering, Movandi Production visibility, usability, & scalability
“ Their big data software and worldwide support has allowed us to manage our yields effectively."
VP Corporate Operations, Diodes Big data scalability & responsive support
“ I am able to do extremely detailed analysis very quickly."
Principal Product Engineer, Xaar Fast, detailed silicon variation analysis
“ yieldHUB makes my team 10 times more efficient."
Principal Engineer - Test Development, ADTechnology Inc Quicker STDF processing time
“ It has the feel of being a customised tool."
VP Manufacturing & Quality, Decawave (Now Qorvo) Flexible to support manufacturing challenges
“ With a simple click, it can take you all the way down to a single die."
Director of Product & Quality Engineering, Cambridge GaN Devices Die-level correlation across stages
“ We were able to improve the yield by 4% and it’s now very stable."
Product Development Manager, EnSilica Improved yield & stabilized ramp
“ I can identify problems in just one minute."
Principal Engineer - Test Development, ADTechnology Inc Rapid root cause identification
“ yieldHUB plays a very important daily role in our PE and QE teams."
Director of Product & Quality Engineering, Cambridge GaN Devices Used daily in PE & QE teams
“ You can log in from any web browser and do loads of data correlations."
Director of Product & Quality Engineering, Cambridge GaN Devices
“ I like the system for its ability to be a one-stop shop for data review, statistical analysis, and reporting."
Product Engineering Manager, Infineon Consolidates data review, analysis, & reporting in one system
“ yieldHUB increased productivity 60 times in that case."
Product Engineering Manager, Infineon Reduced analysis time from hours to minutes.
“ It’s much faster typically in yieldHUB."
Product Engineer, Movandi Accelerates routine production yield investigations
“ With yieldHUB it’s easy to connect the chip data to the module data."
Product Engineer, Movandi
“ We are extremely pleased with yieldHUB and its ability to cope with our high production volume."
Engineer, Raspberry Pi Handles high-volume production data
“ Something that’s very helpful to us is the ability within yieldHUB to click and drill down, by test or by part."
Engineer, Raspberry Pi
“ It’s helped us to beat our turnaround time in development."
Test Engineer, Boréas Technologies Improved development speed and time-to-market.
“ Your customer service has always been perfect."
Test Engineer, Boréas Technologies Highly responsive support
“ It must be in one well-integrated system where you can run correlation at different stages."
Director of Product & Quality Engineering, Cambridge GaN Devices Correlation across production stages
“ yieldHUB has been organized quite well and it’s easy to use."
Director of Product & Quality Engineering, Cambridge GaN Devices
“ We need to drill down to the site level detail to see if the spec requirements are well met."
Director of Product & Quality Engineering, Cambridge GaN Devices Enables detailed site-level performance validation before assembly.
“ In case of any fab issue, then you can contact the Foundry guys and share the data."
Director of Product & Quality Engineering, Cambridge GaN Devices
“ yieldHUB enabled us to aggregate all collected data quickly and visualize the data in one place."
Senior Manager of Product Engineering, Ambiq Multi-OSAT data consolidation
“ yieldHUB’s speed and scalability have been impressive."
Senior Manager of Product Engineering, Ambiq Years of data, Die-level visibility
“ The genealogy correlation enables me to notice any issue as it happened."
Senior Manager of Product Engineering, Ambiq
“ yieldHUB has made my job much easier by linking wafer fab data all the way to final test."
Senior Manager of Product Engineering, Ambiq Fab-to-final-test linkage
“ Data extraction is a breeze."
Director of Product & Test Engineering, EdgeQ
“ Days of effort that were required before we had yieldHUB have now been eliminated."
Director of Product & Test Engineering, EdgeQ Manual data crunching removed
“ The platform is simple to use to extract data from any tests."
Director of Product & Test Engineering, EdgeQ Statistical limits & graphical summaries
“ We have greatly exceeded our goals in a shorter time frame than expected."
VP of Quality, Integra Technologies ROI exceeded & statistical yield limits deployed
“ We were able to reduce average cycle times by over 70%."
VP of Quality, Integra Technologies
“ Our test yield has become better through proactive Fab improvement."
Chief Project Engineer, TDK
“ It absolutely saves us time"
Chief Project Engineer, TDK Automated abnormality detection
“ yieldHUB coped with over 20 million units in our first year of production."
Engineer, Raspberry Pi 20M+ units & high-volume production
“ yieldHUB has made my job much easier by linking wafer fab data all the way to final test."
Senior Manager of Product Engineering, Ambiq Fab-to-final-test genealogy correlation
“ yieldHUB allows you to upgrade as your product volume scales up."
Director of Product & Quality Engineering, Cambridge GaN Devices Supports growth from NPI to high-volume production
“ Our test yield has become better through proactive Fab improvement."
Chief Project Engineer, TDK Improved test yield through structured statistical limits and Fab collaboration
