Trusted by the industry. Proven results.

Customer-reported results

96% time saved in lot analysis

90% reduction in customer return investigation time

75% faster historical yield comparisons

20–30% productivity increase per engineer

~420 hours returned per engineer per year

01/05

For Product Engineers & IC Designers

Stabilize yield early. Protect performance at scale. Move from isolated reports to structured yield intelligence.

  • Track yield and parametric trends across lots and wafers

  • Compare product performance across multiple manufacturing steps

  • Visualize voltage, temperature and site variation

  • Group lots to review product history and failure Pareto

  • Accelerate NPI and reduce ramp instability

For Test Engineers & Test Development Engineers

Optimize test programs. Diagnose issues faster. Engineers move from data preparation to decision-making.

  • Auto-generate yield and test reports

  • Drill down by tester, probe card, load-board or program

  • Analyze bin behaviour, multisite variation and parametric drift

  • Detect Cpk drift and excursions early

  • Reduce manual STDF handling (3 hours → 5 minutes reported by customers)

For Yield Analysts & Data Engineers

Search, correlate, and analyze at production scale. Transform fragmented data into a unified yield intelligence model.

  • Search across millions of data points from wafer to final test

  • Use ANOVA, parametric distributions and bin pattern charts

  • Perform indexed correlation across parameters and bins

  • Compare historical yield in minutes (75% time saved reported)

  • Reduce analysis time by up to 96%

For Quality & Reliability Engineers

Trace every device. Resolve issues with confidence.Prevent escapes. Protect reputation.

  • Full genealogy tracking with serial number traceability

  • Correlate design, fab and test data

  • Analyze customer returns in hours instead of days (90% time saved reported)

  • Detect outliers before they impact yield or quality

  • Create custom statistical reports (GroupA, OOF, Radeval functions)

For Manufacturing & Operations Engineers

Unify global operations. Increase engineering velocity. Engineering becomes structured, scalable and globally aligned.

  • Monitor site and equipment performance from centralized dashboards

  • Share reports instantly across teams and time zones

  • Automate alerts on yield, bins and parameters

  • Eliminate spreadsheets and brittle scripts

  • Improve engineering productivity by 20–30% per engineer

Engineering productivity at scale

When analysis time is reduced by 90%+: yieldHUB turns yield from a static number into a system you can trust and improve.

  • Engineers reinvest time into yield improvement

  • Drift is detected earlier

  • Customer responses accelerate

  • Ramp stabilizes faster

  • Manufacturing confidence increases

Chosen by top semiconductor companies

“ Days of effort that were required before we had yieldHUB have now been eliminated."

EdgeQ

Data extraction is a breeze

“ I am happy with the speed, and the amount of data yieldHUB is capable of managing."

Ambiq

Speed & scalability

“ Our test yield has become better through proactive Fab improvement and shorter feedback time from the Fab and test house."

TDK

Faster fab improvement

“ The charts and graphs make it easy to identify problems and their causes. It makes my job easier. The team is happier and more productive."

Microchip

Diverse analysis

“ I like the system for its ability to be a one-stop shop for data review, statistical analysis, and reporting."

Infineon

With yieldHUB, we can identify and solve problems.

“ I am impressed by the remarkable speed yieldHUB processes large datasets"

Test Development Engineer, EnSilica

Masters the big data problem

“ yieldHUB’s system is very fast and processes vast amounts of data within minutes."

ADTechnology Inc

10 times more efficient

“ yieldHUB certainly masters the ‘big data’ problem."

Test Development Engineer, EnSilica

Fast big data processing & Cp/Cpk yield optimization

“ The best combination of production visibility and intuitive design."

VP Product & Test Engineering, Movandi

Production visibility, usability, & scalability

“ Their big data software and worldwide support has allowed us to manage our yields effectively."

VP Corporate Operations, Diodes

Big data scalability & responsive support

“ I am able to do extremely detailed analysis very quickly."

Principal Product Engineer, Xaar

Fast, detailed silicon variation analysis

“ yieldHUB makes my team 10 times more efficient."

Principal Engineer - Test Development, ADTechnology Inc

Quicker STDF processing time

“ It has the feel of being a customised tool."

VP Manufacturing & Quality, Decawave (Now Qorvo)

Flexible to support manufacturing challenges

“ With a simple click, it can take you all the way down to a single die."

Director of Product & Quality Engineering, Cambridge GaN Devices

Die-level correlation across stages

“ We were able to improve the yield by 4% and it’s now very stable."

Product Development Manager, EnSilica

Improved yield & stabilized ramp

“ I can identify problems in just one minute."

Principal Engineer - Test Development, ADTechnology Inc

Rapid root cause identification

“ yieldHUB plays a very important daily role in our PE and QE teams."

Director of Product & Quality Engineering, Cambridge GaN Devices

Used daily in PE & QE teams

“ You can log in from any web browser and do loads of data correlations."

Director of Product & Quality Engineering, Cambridge GaN Devices

Browser-based

“ I like the system for its ability to be a one-stop shop for data review, statistical analysis, and reporting."

Product Engineering Manager, Infineon

Consolidates data review, analysis, & reporting in one system

“ yieldHUB increased productivity 60 times in that case."

Product Engineering Manager, Infineon

Reduced analysis time from hours to minutes.

“ It’s much faster typically in yieldHUB."

Product Engineer, Movandi

Accelerates routine production yield investigations

“ With yieldHUB it’s easy to connect the chip data to the module data."

Product Engineer, Movandi

End-to-end traceability

“ We are extremely pleased with yieldHUB and its ability to cope with our high production volume."

Engineer, Raspberry Pi

Handles high-volume production data

“ Something that’s very helpful to us is the ability within yieldHUB to click and drill down, by test or by part."

Engineer, Raspberry Pi

Enables fast drill-down

“ It’s helped us to beat our turnaround time in development."

Test Engineer, Boréas Technologies

Improved development speed and time-to-market.

“ Your customer service has always been perfect."

Test Engineer, Boréas Technologies

Highly responsive support

“ It must be in one well-integrated system where you can run correlation at different stages."

Director of Product & Quality Engineering, Cambridge GaN Devices

Correlation across production stages

“ yieldHUB has been organized quite well and it’s easy to use."

Director of Product & Quality Engineering, Cambridge GaN Devices

User-friendly design

“ We need to drill down to the site level detail to see if the spec requirements are well met."

Director of Product & Quality Engineering, Cambridge GaN Devices

Enables detailed site-level performance validation before assembly.

“ In case of any fab issue, then you can contact the Foundry guys and share the data."

Director of Product & Quality Engineering, Cambridge GaN Devices

Foundry collaboration

“ yieldHUB enabled us to aggregate all collected data quickly and visualize the data in one place."

Senior Manager of Product Engineering, Ambiq

Multi-OSAT data consolidation

“ yieldHUB’s speed and scalability have been impressive."

Senior Manager of Product Engineering, Ambiq

Years of data, Die-level visibility

“ The genealogy correlation enables me to notice any issue as it happened."

Senior Manager of Product Engineering, Ambiq

End-to-end traceability

“ yieldHUB has made my job much easier by linking wafer fab data all the way to final test."

Senior Manager of Product Engineering, Ambiq

Fab-to-final-test linkage

“ Data extraction is a breeze."

Director of Product & Test Engineering, EdgeQ

Automated OSAT uploads

“ Days of effort that were required before we had yieldHUB have now been eliminated."

Director of Product & Test Engineering, EdgeQ

Manual data crunching removed

“ The platform is simple to use to extract data from any tests."

Director of Product & Test Engineering, EdgeQ

Statistical limits & graphical summaries

“ We have greatly exceeded our goals in a shorter time frame than expected."

VP of Quality, Integra Technologies

ROI exceeded & statistical yield limits deployed

“ We were able to reduce average cycle times by over 70%."

VP of Quality, Integra Technologies

70% cycle time reduction

“ Our test yield has become better through proactive Fab improvement."

Chief Project Engineer, TDK

SYL & SBL deployment

“ It absolutely saves us time"

Chief Project Engineer, TDK

Automated abnormality detection

“ yieldHUB coped with over 20 million units in our first year of production."

Engineer, Raspberry Pi

20M+ units & high-volume production

“ yieldHUB has made my job much easier by linking wafer fab data all the way to final test."

Senior Manager of Product Engineering, Ambiq

Fab-to-final-test genealogy correlation

“ yieldHUB allows you to upgrade as your product volume scales up."

Director of Product & Quality Engineering, Cambridge GaN Devices

Supports growth from NPI to high-volume production

“ Our test yield has become better through proactive Fab improvement."

Chief Project Engineer, TDK

Improved test yield through structured statistical limits and Fab collaboration

/ 45

Start the conversation

Talk to us and see the platform in action