Structured analytics for wafer fabrication at scale
Foundries manage advanced nodes, complex processes and large wafer volumes. Customer satisfaction depends on stable WAT performance and downstream yield correlation. yieldHUB enhances visibility into parametric stability and process-driven yield interactions.
Customer yield often reflects upstream fab behavior.
Link WAT data to wafer sort and final test
Identify systematic process drivers
Improve fab-to-customer feedback cycles
Detect process drift early
Uncontrolled variation leads to costly yield excursions.
Monitor parametric distributions over time
Identify tool-induced variation
Reduce scrap and excursion impact
Automatic data cleansing & consolidation
yieldHUB transforms raw manufacturing and test data into a clean, trusted insights for analysis. It automatically validates, corrects, and cleans data so engineers can spend less time on spreadsheets and more time uncovering insights that matter.
Detects and resolves inconsistencies before they affect results
Brings data from multiple formats into one unified standard
Cuts manual prep time, freeing engineers to focus on performance
Discover root cause of issues
When yields slip, yieldHUB reveals why. The platform’s intelligent analytics exposes patterns, correlations, and anomalies across massive datasets, helping engineers move from observation to understanding in minutes, not days.
Recognizes recurring defect patterns and parameter shifts automatically
Enables deep, flexible exploration through dynamic drill-downs
Speeds up discovery with integrated statistical and visualization tools
Get instantaneous trend analysis
yieldHUB delivers instant trend visualization across millions of datapoints, enabling immediate reaction to process drift or excursions.
Real-time dashboards with automated alerts
Scalable analysis across large datasets
Rapid detection of anomalies and yield excursions
Leverage equipment commonality analysis
yieldHUB helps identify tool or equipment related yield variations through side-by-side comparison and correlation analytics. It turns equipment data into actionable insight.
Detects systematic yield shifts tied to equipment
Compares performance across tools, lots and sites
Supports predictive maintenance and process control
Connect people, not just data
With yieldHUB, teams don’t just share data, they share an understanding. Whether across the hall or across the world, engineers can explore results together, discuss insights in real-time and move forward as one.
Shared dashboards and live reports that spark real conversation
Secure access for colleagues, partners and suppliers alike
Decisions made faster, with everyone aligned and informed
Top semiconductor companies choose yieldHUB
“Days of effort that were required before we had yieldHUB have now been eliminated."
EdgeQ
Data extraction is a breeze
“I am happy with the speed, and the amount of data yieldHUB is capable of managing."
Ambiq
Speed & scalability
“Our test yield has become better through proactive Fab improvement and shorter feedback time from the Fab and test house."
TDK
Faster fab improvement
“The charts and graphs make it easy to identify problems and their causes. It makes my job easier. The team is happier and more productive."
Microchip
Diverse analysis
“I like the system for its ability to be a one-stop shop for data review, statistical analysis, and reporting."
Infineon
With yieldHUB, we can identify and solve problems.
“I am impressed by the remarkable speed yieldHUB processes large datasets"
Test Development Engineer, EnSilica
Masters the big data problem
“yieldHUB’s system is very fast and processes vast amounts of data within minutes."
ADTechnology Inc
10 times more efficient
“yieldHUB certainly masters the ‘big data’ problem."
Test Development Engineer, EnSilica
Fast big data processing & Cp/Cpk yield optimization
“The best combination of production visibility and intuitive design."
VP Product & Test Engineering, Movandi
Production visibility, usability, & scalability
“Their big data software and worldwide support has allowed us to manage our yields effectively."
VP Corporate Operations, Diodes
Big data scalability & responsive support
“I am able to do extremely detailed analysis very quickly."
Principal Product Engineer, Xaar
Fast, detailed silicon variation analysis
“yieldHUB makes my team 10 times more efficient."
Principal Engineer - Test Development, ADTechnology Inc
Quicker STDF processing time
“It has the feel of being a customised tool."
VP Manufacturing & Quality, Decawave (Now Qorvo)
Flexible to support manufacturing challenges
“With a simple click, it can take you all the way down to a single die."
Director of Product & Quality Engineering, Cambridge GaN Devices
Die-level correlation across stages
“We were able to improve the yield by 4% and it’s now very stable."
Product Development Manager, EnSilica
Improved yield & stabilized ramp
“I can identify problems in just one minute."
Principal Engineer - Test Development, ADTechnology Inc
Rapid root cause identification
“yieldHUB plays a very important daily role in our PE and QE teams."
Director of Product & Quality Engineering, Cambridge GaN Devices
Used daily in PE & QE teams
“You can log in from any web browser and do loads of data correlations."
Director of Product & Quality Engineering, Cambridge GaN Devices
Browser-based
“I like the system for its ability to be a one-stop shop for data review, statistical analysis, and reporting."
Product Engineering Manager, Infineon
Consolidates data review, analysis, & reporting in one system
“yieldHUB increased productivity 60 times in that case."
Product Engineering Manager, Infineon
Reduced analysis time from hours to minutes.
“It’s much faster typically in yieldHUB."
Product Engineer, Movandi
Accelerates routine production yield investigations
“With yieldHUB it’s easy to connect the chip data to the module data."
Product Engineer, Movandi
End-to-end traceability
“We are extremely pleased with yieldHUB and its ability to cope with our high production volume."
Engineer, Raspberry Pi
Handles high-volume production data
“Something that’s very helpful to us is the ability within yieldHUB to click and drill down, by test or by part."
Engineer, Raspberry Pi
Enables fast drill-down
“It’s helped us to beat our turnaround time in development."
Test Engineer, Boréas Technologies
Improved development speed and time-to-market.
“Your customer service has always been perfect."
Test Engineer, Boréas Technologies
Highly responsive support
“It must be in one well-integrated system where you can run correlation at different stages."
Director of Product & Quality Engineering, Cambridge GaN Devices
Correlation across production stages
“yieldHUB has been organized quite well and it’s easy to use."
Director of Product & Quality Engineering, Cambridge GaN Devices
User-friendly design
“We need to drill down to the site level detail to see if the spec requirements are well met."
Director of Product & Quality Engineering, Cambridge GaN Devices
Enables detailed site-level performance validation before assembly.
“In case of any fab issue, then you can contact the Foundry guys and share the data."
Director of Product & Quality Engineering, Cambridge GaN Devices
Foundry collaboration
“yieldHUB enabled us to aggregate all collected data quickly and visualize the data in one place."
Senior Manager of Product Engineering, Ambiq
Multi-OSAT data consolidation
“yieldHUB’s speed and scalability have been impressive."
Senior Manager of Product Engineering, Ambiq
Years of data, Die-level visibility
“The genealogy correlation enables me to notice any issue as it happened."
Senior Manager of Product Engineering, Ambiq
End-to-end traceability
“yieldHUB has made my job much easier by linking wafer fab data all the way to final test."
Senior Manager of Product Engineering, Ambiq
Fab-to-final-test linkage
“Data extraction is a breeze."
Director of Product & Test Engineering, EdgeQ
Automated OSAT uploads
“Days of effort that were required before we had yieldHUB have now been eliminated."
Director of Product & Test Engineering, EdgeQ
Manual data crunching removed
“The platform is simple to use to extract data from any tests."
Director of Product & Test Engineering, EdgeQ
Statistical limits & graphical summaries
“We have greatly exceeded our goals in a shorter time frame than expected."
VP of Quality, Integra Technologies
ROI exceeded & statistical yield limits deployed
“We were able to reduce average cycle times by over 70%."
VP of Quality, Integra Technologies
70% cycle time reduction
“Our test yield has become better through proactive Fab improvement."
Chief Project Engineer, TDK
SYL & SBL deployment
“It absolutely saves us time"
Chief Project Engineer, TDK
Automated abnormality detection
“yieldHUB coped with over 20 million units in our first year of production."
Engineer, Raspberry Pi
20M+ units & high-volume production
“yieldHUB has made my job much easier by linking wafer fab data all the way to final test."
Senior Manager of Product Engineering, Ambiq
Fab-to-final-test genealogy correlation
“yieldHUB allows you to upgrade as your product volume scales up."
Director of Product & Quality Engineering, Cambridge GaN Devices
Supports growth from NPI to high-volume production
“Our test yield has become better through proactive Fab improvement."
Chief Project Engineer, TDK
Improved test yield through structured statistical limits and Fab collaboration
