Trusted on live production floors at fabless companies, IDMs and OSATs.

Most “real-time” test analytics is not real-time.

It waits for the lot to finish, the files to upload, an engineer to open a report. By then the scrap exists. If the answer arrives after the lot, it is a post-mortem. yieldHUB Live works while the wafer is still on the prober.

  • Analyzed on the tester, device by device

  • Analyze parametric activity

  • Fix, continue or stop, decided in seconds

  • Idle testers flagged as they go idle

What yieldHUB Live does

Turn live test data into real-time intelligence.

  • Increase yield, throughput, tester utilisation, and OEE through continuous analysis of live production data

  • Detect yield loss, parametric drift, equipment issues and process variation before they impact production

  • Recommend the best course of action using live production intelligence

  • Predict, recommend, and automate the next best action through intelligent alerts, contextual recommendations and direct communication with handlers and test equipment

  • You stay in control: your thresholds, alerts ranked by impact, stops only where you enable them

Go beyond MES

MES records production. Post-lot reports explain it. yieldHUB Live acts on it, mid-lot.

  • Reports tell you what happened; Live changes what happens next

  • Improve cycle time and engineering productivity

  • Eliminate delays caused by manual reporting

Broad tester compatibility

Deploy without disrupting production.

  • Wafer probe and final test, with no impact on test time

  • Legacy and next-generation testers, including non-STDF

  • No hardware upgrades, no test program changes

Real-time manufacturing intelligence

Understand production while it's running.

  • Configurable dashboards for factory visualization

  • Detect emerging yield issues before they propagate

  • Maintain stable performance across testers, lots and sites

  • Prioritize the issues with the greatest operational impact

Maximise existing test capacity

More good parts, first time, from the floor you already own. Small utilization gains are capex you never spend.

  • Increase tester utilisation and OEE

  • Recover lost capacity caused by unnecessary retest

  • Increase throughput without expanding test infrastructure

  • Increase first pass yield

For IDMs

The IQ of your in-house test floor.

  • Optimize in-house wafer probe and final test

  • Compare performance across internal and outsourced sites

  • Increase yield, throughput, tester utilisation, and OEE

  • Detect yield and parametric drift in real time

  • Improve manufacturing control and operational efficiency

  • Accelerate engineering decisions across every test floor

For OSATs

Improve factory performance across every customer and site.

  • Increase factory utilisation and throughput

  • Improve on-time delivery and operational efficiency

  • Standardize operations across global facilities

For fabless companies

Gain operational intelligence across outsourced test.

  • Compare OSAT performance in real time

  • Detect yield and performance drift across manufacturing partners

  • Strengthen supplier oversight and manufacturing control

More detail?

Frequently Asked Questions

Answers to common questions about the yieldHUB platform, data integration, deployment, and…

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Explainer Videos & Podcasts

Short explainers, podcasts, product walkthroughs, and customer conversations on semiconduc…

01/06

Trusted by the industry. Proven in production.

“ Days of effort that were required before we had yieldHUB have now been eliminated."

EdgeQ

Data extraction is a breeze

“ I am happy with the speed, and the amount of data yieldHUB is capable of managing."

Ambiq

Speed & scalability

“ Our test yield has become better through proactive Fab improvement and shorter feedback time from the Fab and test house."

TDK

Faster fab improvement

“ The charts and graphs make it easy to identify problems and their causes. It makes my job easier. The team is happier and more productive."

Microchip

Diverse analysis

“ I like the system for its ability to be a one-stop shop for data review, statistical analysis, and reporting."

Infineon

With yieldHUB, we can identify and solve problems.

“ I am impressed by the remarkable speed yieldHUB processes large datasets"

Test Development Engineer, EnSilica

Masters the big data problem

“ yieldHUB’s system is very fast and processes vast amounts of data within minutes."

ADTechnology Inc

10 times more efficient

“ yieldHUB certainly masters the ‘big data’ problem."

Test Development Engineer, EnSilica

Fast big data processing & Cp/Cpk yield optimization

“ The best combination of production visibility and intuitive design."

VP Product & Test Engineering, Movandi

Production visibility, usability, & scalability

“ Their big data software and worldwide support has allowed us to manage our yields effectively."

VP Corporate Operations, Diodes

Big data scalability & responsive support

“ I am able to do extremely detailed analysis very quickly."

Principal Product Engineer, Xaar

Fast, detailed silicon variation analysis

“ yieldHUB makes my team 10 times more efficient."

Principal Engineer - Test Development, ADTechnology Inc

Quicker STDF processing time

“ It has the feel of being a customised tool."

VP Manufacturing & Quality, Decawave (Now Qorvo)

Flexible to support manufacturing challenges

“ With a simple click, it can take you all the way down to a single die."

Director of Product & Quality Engineering, Cambridge GaN Devices

Die-level correlation across stages

“ We were able to improve the yield by 4% and it’s now very stable."

Product Development Manager, EnSilica

Improved yield & stabilized ramp

“ I can identify problems in just one minute."

Principal Engineer - Test Development, ADTechnology Inc

Rapid root cause identification

“ yieldHUB plays a very important daily role in our PE and QE teams."

Director of Product & Quality Engineering, Cambridge GaN Devices

Used daily in PE & QE teams

“ You can log in from any web browser and do loads of data correlations."

Director of Product & Quality Engineering, Cambridge GaN Devices

Browser-based

“ I like the system for its ability to be a one-stop shop for data review, statistical analysis, and reporting."

Product Engineering Manager, Infineon

Consolidates data review, analysis, & reporting in one system

“ yieldHUB increased productivity 60 times in that case."

Product Engineering Manager, Infineon

Reduced analysis time from hours to minutes.

“ It’s much faster typically in yieldHUB."

Product Engineer, Movandi

Accelerates routine production yield investigations

“ With yieldHUB it’s easy to connect the chip data to the module data."

Product Engineer, Movandi

End-to-end traceability

“ We are extremely pleased with yieldHUB and its ability to cope with our high production volume."

Engineer, Raspberry Pi

Handles high-volume production data

“ Something that’s very helpful to us is the ability within yieldHUB to click and drill down, by test or by part."

Engineer, Raspberry Pi

Enables fast drill-down

“ It’s helped us to beat our turnaround time in development."

Test Engineer, Boréas Technologies

Improved development speed and time-to-market.

“ Your customer service has always been perfect."

Test Engineer, Boréas Technologies

Highly responsive support

“ It must be in one well-integrated system where you can run correlation at different stages."

Director of Product & Quality Engineering, Cambridge GaN Devices

Correlation across production stages

“ yieldHUB has been organized quite well and it’s easy to use."

Director of Product & Quality Engineering, Cambridge GaN Devices

User-friendly design

“ We need to drill down to the site level detail to see if the spec requirements are well met."

Director of Product & Quality Engineering, Cambridge GaN Devices

Enables detailed site-level performance validation before assembly.

“ In case of any fab issue, then you can contact the Foundry guys and share the data."

Director of Product & Quality Engineering, Cambridge GaN Devices

Foundry collaboration

“ yieldHUB enabled us to aggregate all collected data quickly and visualize the data in one place."

Senior Manager of Product Engineering, Ambiq

Multi-OSAT data consolidation

“ yieldHUB’s speed and scalability have been impressive."

Senior Manager of Product Engineering, Ambiq

Years of data, Die-level visibility

“ The genealogy correlation enables me to notice any issue as it happened."

Senior Manager of Product Engineering, Ambiq

End-to-end traceability

“ yieldHUB has made my job much easier by linking wafer fab data all the way to final test."

Senior Manager of Product Engineering, Ambiq

Fab-to-final-test linkage

“ Data extraction is a breeze."

Director of Product & Test Engineering, EdgeQ

Automated OSAT uploads

“ Days of effort that were required before we had yieldHUB have now been eliminated."

Director of Product & Test Engineering, EdgeQ

Manual data crunching removed

“ The platform is simple to use to extract data from any tests."

Director of Product & Test Engineering, EdgeQ

Statistical limits & graphical summaries

“ We have greatly exceeded our goals in a shorter time frame than expected."

VP of Quality, Integra Technologies

ROI exceeded & statistical yield limits deployed

“ We were able to reduce average cycle times by over 70%."

VP of Quality, Integra Technologies

70% cycle time reduction

“ Our test yield has become better through proactive Fab improvement."

Chief Project Engineer, TDK

SYL & SBL deployment

“ It absolutely saves us time"

Chief Project Engineer, TDK

Automated abnormality detection

“ yieldHUB coped with over 20 million units in our first year of production."

Engineer, Raspberry Pi

20M+ units & high-volume production

“ yieldHUB has made my job much easier by linking wafer fab data all the way to final test."

Senior Manager of Product Engineering, Ambiq

Fab-to-final-test genealogy correlation

“ yieldHUB allows you to upgrade as your product volume scales up."

Director of Product & Quality Engineering, Cambridge GaN Devices

Supports growth from NPI to high-volume production

“ Our test yield has become better through proactive Fab improvement."

Chief Project Engineer, TDK

Improved test yield through structured statistical limits and Fab collaboration

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See it on your own data

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