Increase yield, throughput, tester utilisation, and OEE through continuous analysis of live production data
Detect yield loss, parametric drift, equipment issues and process variation before they impact production
Recommend the best course of action using live production intelligence
Predict, recommend, and automate the next best action through intelligent alerts, contextual recommendations and direct communication with handlers and test equipment
Go beyond MES
MES records production. yieldHUB Live optimizes it.
Analyze live production as it happens
Improve cycle time and engineering productivity
Eliminate delays caused by manual reporting
Broad tester compatibility
Deploy without disrupting production.
Support wafer probe and final test with no impact on test time.
Deploy across legacy and next-generation testers
Eliminate hardware upgrades and test program changes
Real-time manufacturing intelligence
Understand production while it's running.
Configurable dashboards for factory visualization
Detect emerging yield issues before they propagate
Maintain stable performance across testers, lots and sites
Prioritize the issues with the greatest operational impact
Maximise existing test capacity
Unlock more performance from every tester. Small utilization improvements quickly translate into measurable capacity gains.
Increase tester utilisation and OEE
Recover lost capacity caused by unnecessary retest
Increase throughput without expanding test infrastructure
For IDMs
The IQ of your in-house test floor.
Optimize in-house wafer probe and final test
Compare performance across internal and outsourced sites
Increase yield, throughput, tester utilisation, and OEE
Detect yield and parametric drift in real time
Improve manufacturing control and operational efficiency
Accelerate engineering decisions across every test floor
For OSATs
Improve factory performance across every customer and site.
Increase factory utilisation and throughput
Improve on-time delivery and operational efficiency
Standardize operations across global facilities
For fabless companies
Gain operational intelligence across outsourced test.
Compare OSAT performance in real time
Detect yield and performance drift across manufacturing partners
Strengthen supplier oversight and manufacturing control
Trusted by the industry. Proven in production.
“Days of effort that were required before we had yieldHUB have now been eliminated."
EdgeQ
Data extraction is a breeze
“I am happy with the speed, and the amount of data yieldHUB is capable of managing."
Ambiq
Speed & scalability
“Our test yield has become better through proactive Fab improvement and shorter feedback time from the Fab and test house."
TDK
Faster fab improvement
“The charts and graphs make it easy to identify problems and their causes. It makes my job easier. The team is happier and more productive."
Microchip
Diverse analysis
“I like the system for its ability to be a one-stop shop for data review, statistical analysis, and reporting."
Infineon
With yieldHUB, we can identify and solve problems.
“I am impressed by the remarkable speed yieldHUB processes large datasets"
Test Development Engineer, EnSilica
Masters the big data problem
“yieldHUB’s system is very fast and processes vast amounts of data within minutes."
ADTechnology Inc
10 times more efficient
“yieldHUB certainly masters the ‘big data’ problem."
Test Development Engineer, EnSilica
Fast big data processing & Cp/Cpk yield optimization
“The best combination of production visibility and intuitive design."
VP Product & Test Engineering, Movandi
Production visibility, usability, & scalability
“Their big data software and worldwide support has allowed us to manage our yields effectively."
VP Corporate Operations, Diodes
Big data scalability & responsive support
“I am able to do extremely detailed analysis very quickly."
Principal Product Engineer, Xaar
Fast, detailed silicon variation analysis
“yieldHUB makes my team 10 times more efficient."
Principal Engineer - Test Development, ADTechnology Inc
Quicker STDF processing time
“It has the feel of being a customised tool."
VP Manufacturing & Quality, Decawave (Now Qorvo)
Flexible to support manufacturing challenges
“With a simple click, it can take you all the way down to a single die."
Director of Product & Quality Engineering, Cambridge GaN Devices
Die-level correlation across stages
“We were able to improve the yield by 4% and it’s now very stable."
Product Development Manager, EnSilica
Improved yield & stabilized ramp
“I can identify problems in just one minute."
Principal Engineer - Test Development, ADTechnology Inc
Rapid root cause identification
“yieldHUB plays a very important daily role in our PE and QE teams."
Director of Product & Quality Engineering, Cambridge GaN Devices
Used daily in PE & QE teams
“You can log in from any web browser and do loads of data correlations."
Director of Product & Quality Engineering, Cambridge GaN Devices
Browser-based
“I like the system for its ability to be a one-stop shop for data review, statistical analysis, and reporting."
Product Engineering Manager, Infineon
Consolidates data review, analysis, & reporting in one system
“yieldHUB increased productivity 60 times in that case."
Product Engineering Manager, Infineon
Reduced analysis time from hours to minutes.
“It’s much faster typically in yieldHUB."
Product Engineer, Movandi
Accelerates routine production yield investigations
“With yieldHUB it’s easy to connect the chip data to the module data."
Product Engineer, Movandi
End-to-end traceability
“We are extremely pleased with yieldHUB and its ability to cope with our high production volume."
Engineer, Raspberry Pi
Handles high-volume production data
“Something that’s very helpful to us is the ability within yieldHUB to click and drill down, by test or by part."
Engineer, Raspberry Pi
Enables fast drill-down
“It’s helped us to beat our turnaround time in development."
Test Engineer, Boréas Technologies
Improved development speed and time-to-market.
“Your customer service has always been perfect."
Test Engineer, Boréas Technologies
Highly responsive support
“It must be in one well-integrated system where you can run correlation at different stages."
Director of Product & Quality Engineering, Cambridge GaN Devices
Correlation across production stages
“yieldHUB has been organized quite well and it’s easy to use."
Director of Product & Quality Engineering, Cambridge GaN Devices
User-friendly design
“We need to drill down to the site level detail to see if the spec requirements are well met."
Director of Product & Quality Engineering, Cambridge GaN Devices
Enables detailed site-level performance validation before assembly.
“In case of any fab issue, then you can contact the Foundry guys and share the data."
Director of Product & Quality Engineering, Cambridge GaN Devices
Foundry collaboration
“yieldHUB enabled us to aggregate all collected data quickly and visualize the data in one place."
Senior Manager of Product Engineering, Ambiq
Multi-OSAT data consolidation
“yieldHUB’s speed and scalability have been impressive."
Senior Manager of Product Engineering, Ambiq
Years of data, Die-level visibility
“The genealogy correlation enables me to notice any issue as it happened."
Senior Manager of Product Engineering, Ambiq
End-to-end traceability
“yieldHUB has made my job much easier by linking wafer fab data all the way to final test."
Senior Manager of Product Engineering, Ambiq
Fab-to-final-test linkage
“Data extraction is a breeze."
Director of Product & Test Engineering, EdgeQ
Automated OSAT uploads
“Days of effort that were required before we had yieldHUB have now been eliminated."
Director of Product & Test Engineering, EdgeQ
Manual data crunching removed
“The platform is simple to use to extract data from any tests."
Director of Product & Test Engineering, EdgeQ
Statistical limits & graphical summaries
“We have greatly exceeded our goals in a shorter time frame than expected."
VP of Quality, Integra Technologies
ROI exceeded & statistical yield limits deployed
“We were able to reduce average cycle times by over 70%."
VP of Quality, Integra Technologies
70% cycle time reduction
“Our test yield has become better through proactive Fab improvement."
Chief Project Engineer, TDK
SYL & SBL deployment
“It absolutely saves us time"
Chief Project Engineer, TDK
Automated abnormality detection
“yieldHUB coped with over 20 million units in our first year of production."
Engineer, Raspberry Pi
20M+ units & high-volume production
“yieldHUB has made my job much easier by linking wafer fab data all the way to final test."
Senior Manager of Product Engineering, Ambiq
Fab-to-final-test genealogy correlation
“yieldHUB allows you to upgrade as your product volume scales up."
Director of Product & Quality Engineering, Cambridge GaN Devices
Supports growth from NPI to high-volume production
“Our test yield has become better through proactive Fab improvement."
Chief Project Engineer, TDK
Improved test yield through structured statistical limits and Fab collaboration
