Accelerate ramp in high-volume launches

Consumer devices demand rapid transition from first silicon to millions of units per week. yieldHUB enables controlled ramp-to-volume with real-time visibility across global production environments.

  • Real-time monitoring of wafer probe (CP) and final test (FT)

  • Rapid identification of bin fallout drivers

  • Automated excursion detection across early lots

  • CP-to-FT correlation during aggressive ramp schedules

  • Site-to-site performance benchmarking in high-parallel ATE environments

  • Early yield limiter detection before scale amplifies impact

Protect margin through test & yield optimization

In high-volume consumer markets, small inefficiencies multiply quickly. A 1% yield improvement can translate into millions in recovered revenue.

  • Identify redundant or low-value test insertions

  • Analyze test time distribution and cost per unit

  • Guardband sensitivity analysis to balance quality and throughput

  • Detect systematic tool-to-tool and tester-to-tester variation

  • Reduce scrap and re-test cycles

Real-time global production visibility

Consumer semiconductor supply chains are globally distributed across fabs, OSATs, and subcontract test houses. yieldHUB creates a unified intelligence layer across all sites.

  • Multi-site yield and performance dashboards

  • Secure collaboration with foundries and OSAT partners

  • Cross-site excursion detection and escalation

  • Standardized KPI reporting across business units

  • Controlled access for regional operations teams

Built for extreme volume environments

Consumer semiconductor manufacturing requires infrastructure that scales without slowing production.

  • High-parallel ATE data ingestion

  • Continuous data streaming without hardware modification

  • Independent of tester platform or operating system

  • Scalable architecture for billions of devices

  • Historical trend analysis across product generations

Designed for consumer semiconductor applications

yieldHUB supports high-volume production across:

  • Smartphone and mobile SoCs

  • Wearables and low-power IoT devices

  • Wi-Fi, Bluetooth and connectivity chips

  • Display drivers and imaging sensors

  • Consumer power management ICs

  • Audio and mixed-signal devices

Trusted by the industry. Proven in production.

“ Days of effort that were required before we had yieldHUB have now been eliminated."

EdgeQ

Data extraction is a breeze

“ I am happy with the speed, and the amount of data yieldHUB is capable of managing."

Ambiq

Speed & scalability

“ Our test yield has become better through proactive Fab improvement and shorter feedback time from the Fab and test house."

TDK

Faster fab improvement

“ The charts and graphs make it easy to identify problems and their causes. It makes my job easier. The team is happier and more productive."

Microchip

Diverse analysis

“ I like the system for its ability to be a one-stop shop for data review, statistical analysis, and reporting."

Infineon

With yieldHUB, we can identify and solve problems.

“ I am impressed by the remarkable speed yieldHUB processes large datasets"

Test Development Engineer, EnSilica

Masters the big data problem

“ yieldHUB’s system is very fast and processes vast amounts of data within minutes."

ADTechnology Inc

10 times more efficient

“ yieldHUB certainly masters the ‘big data’ problem."

Test Development Engineer, EnSilica

Fast big data processing & Cp/Cpk yield optimization

“ The best combination of production visibility and intuitive design."

VP Product & Test Engineering, Movandi

Production visibility, usability, & scalability

“ Their big data software and worldwide support has allowed us to manage our yields effectively."

VP Corporate Operations, Diodes

Big data scalability & responsive support

“ I am able to do extremely detailed analysis very quickly."

Principal Product Engineer, Xaar

Fast, detailed silicon variation analysis

“ yieldHUB makes my team 10 times more efficient."

Principal Engineer - Test Development, ADTechnology Inc

Quicker STDF processing time

“ It has the feel of being a customised tool."

VP Manufacturing & Quality, Decawave (Now Qorvo)

Flexible to support manufacturing challenges

“ With a simple click, it can take you all the way down to a single die."

Director of Product & Quality Engineering, Cambridge GaN Devices

Die-level correlation across stages

“ We were able to improve the yield by 4% and it’s now very stable."

Product Development Manager, EnSilica

Improved yield & stabilized ramp

“ I can identify problems in just one minute."

Principal Engineer - Test Development, ADTechnology Inc

Rapid root cause identification

“ yieldHUB plays a very important daily role in our PE and QE teams."

Director of Product & Quality Engineering, Cambridge GaN Devices

Used daily in PE & QE teams

“ You can log in from any web browser and do loads of data correlations."

Director of Product & Quality Engineering, Cambridge GaN Devices

Browser-based

“ I like the system for its ability to be a one-stop shop for data review, statistical analysis, and reporting."

Product Engineering Manager, Infineon

Consolidates data review, analysis, & reporting in one system

“ yieldHUB increased productivity 60 times in that case."

Product Engineering Manager, Infineon

Reduced analysis time from hours to minutes.

“ It’s much faster typically in yieldHUB."

Product Engineer, Movandi

Accelerates routine production yield investigations

“ With yieldHUB it’s easy to connect the chip data to the module data."

Product Engineer, Movandi

End-to-end traceability

“ We are extremely pleased with yieldHUB and its ability to cope with our high production volume."

Engineer, Raspberry Pi

Handles high-volume production data

“ Something that’s very helpful to us is the ability within yieldHUB to click and drill down, by test or by part."

Engineer, Raspberry Pi

Enables fast drill-down

“ It’s helped us to beat our turnaround time in development."

Test Engineer, Boréas Technologies

Improved development speed and time-to-market.

“ Your customer service has always been perfect."

Test Engineer, Boréas Technologies

Highly responsive support

“ It must be in one well-integrated system where you can run correlation at different stages."

Director of Product & Quality Engineering, Cambridge GaN Devices

Correlation across production stages

“ yieldHUB has been organized quite well and it’s easy to use."

Director of Product & Quality Engineering, Cambridge GaN Devices

User-friendly design

“ We need to drill down to the site level detail to see if the spec requirements are well met."

Director of Product & Quality Engineering, Cambridge GaN Devices

Enables detailed site-level performance validation before assembly.

“ In case of any fab issue, then you can contact the Foundry guys and share the data."

Director of Product & Quality Engineering, Cambridge GaN Devices

Foundry collaboration

“ yieldHUB enabled us to aggregate all collected data quickly and visualize the data in one place."

Senior Manager of Product Engineering, Ambiq

Multi-OSAT data consolidation

“ yieldHUB’s speed and scalability have been impressive."

Senior Manager of Product Engineering, Ambiq

Years of data, Die-level visibility

“ The genealogy correlation enables me to notice any issue as it happened."

Senior Manager of Product Engineering, Ambiq

End-to-end traceability

“ yieldHUB has made my job much easier by linking wafer fab data all the way to final test."

Senior Manager of Product Engineering, Ambiq

Fab-to-final-test linkage

“ Data extraction is a breeze."

Director of Product & Test Engineering, EdgeQ

Automated OSAT uploads

“ Days of effort that were required before we had yieldHUB have now been eliminated."

Director of Product & Test Engineering, EdgeQ

Manual data crunching removed

“ The platform is simple to use to extract data from any tests."

Director of Product & Test Engineering, EdgeQ

Statistical limits & graphical summaries

“ We have greatly exceeded our goals in a shorter time frame than expected."

VP of Quality, Integra Technologies

ROI exceeded & statistical yield limits deployed

“ We were able to reduce average cycle times by over 70%."

VP of Quality, Integra Technologies

70% cycle time reduction

“ Our test yield has become better through proactive Fab improvement."

Chief Project Engineer, TDK

SYL & SBL deployment

“ It absolutely saves us time"

Chief Project Engineer, TDK

Automated abnormality detection

“ yieldHUB coped with over 20 million units in our first year of production."

Engineer, Raspberry Pi

20M+ units & high-volume production

“ yieldHUB has made my job much easier by linking wafer fab data all the way to final test."

Senior Manager of Product Engineering, Ambiq

Fab-to-final-test genealogy correlation

“ yieldHUB allows you to upgrade as your product volume scales up."

Director of Product & Quality Engineering, Cambridge GaN Devices

Supports growth from NPI to high-volume production

“ Our test yield has become better through proactive Fab improvement."

Chief Project Engineer, TDK

Improved test yield through structured statistical limits and Fab collaboration

/ 45

Start the conversation

Talk to us and see the platform in action