Built for functional safety environments
Safety-critical semiconductor applications support automotive safety systems, industrial controls, power infrastructure, medical platforms and avionics. yieldHUB strengthens manufacturing discipline in environments governed by ISO 26262, IEC 61508 and DO-254 functional safety frameworks.
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ISO 26262 and ASIL development environments
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IEC 61508 functional safety
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DO-254 hardware design assurance
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IATF 16949 quality systems
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AEC-Q100, AEC-Q101 and AEC-Q102 qualification
Prevent escaped defects before they reach the field
In safety-critical systems, even a low defect rate can create unacceptable risk. yieldHUB enables proactive detection of parametric drift, lot anomalies and abnormal behaviour before parts are released into production.
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Automated parametric and bin outlier detection
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Stuck-part detection using real-time tester technology. No hardware required.
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Dynamic and static part average testing
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Multi-lot and within-lot anomaly monitoring
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Statistical bin limit enforcement
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Drift analysis during burn-in and life testing
Strengthen release decisions during soft launch and ramp
During soft launch and early production ramp, safety margins must be validated under real manufacturing conditions. yieldHUB provides population-level insight to ensure stability before scaling to volume production.
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Yield and parametric trend monitoring across lots
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Early life failure rate detection
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Gage R&R for multi-site validation
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Program revision and limit change detection
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Real-time alerts for yield or parametric excursions
Trace every device across the manufacturing flow
When field returns or safety investigations occur, rapid traceability is essential. yieldHUB links wafer fabrication, assembly and final test into one structured genealogy, enabling fast root cause isolation.
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Full wafer lot, wafer ID and XY traceability
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Device-level genealogy from fab to final test
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Serialised lookup for RMA and field analysis
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Cross-stage correlation from WAT to final test
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Audit-ready reporting for regulatory review
Support structured corrective action workflows
Safety-critical manufacturing requires disciplined containment and corrective action processes. yieldHUB provides the data foundation necessary to support 8D investigations and structured root cause analysis.
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Rapid filtering across large datasets
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Consolidated datalog cleansing prior to analysis
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Statistical visualisation for evidence-based decisions
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Shared dashboards for cross-functional teams
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Long-term retention of corrective action history
Maintain control in complex supply chains
Safety-critical semiconductor programmes often span multiple fabs, OSATs and test sites. yieldHUB centralises data while maintaining strict control over access and visibility.
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Secure on-premise or AWS cloud deployment
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Role-based access control
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Real-time corrective actions on the test floor
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Segregation of programme data
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Controlled collaboration with approved partners
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Knowledge base for team collaboration
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Scalable analytics across low and high-volume production
Because safety margins are not optional
Safety-critical semiconductor manufacturing demands more than yield improvement. It requires disciplined analytics, structured traceability and proactive anomaly detection across every stage of production. yieldHUB delivers the statistical control and lifecycle visibility required to protect safety-critical systems from soft launch through sustained production.
Trusted by the industry. Proven in production.
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