Limerick, Ireland, 4 September 2026, yieldHUB, a provider of yield management software for the semiconductor industry, will exhibit at the UK Silicon Carbide Network Conference at the University of Warwick on 7 and 8 September.

The two-day conference brings together the UK's silicon carbide ecosystem, including semiconductor companies, equipment suppliers, universities, Catapult centres and policymakers, for technical sessions covering manufacturing, equipment, packaging, applications and policy.

Kevin Robinson, VP Operations at yieldHUB, will represent the company across both days and is available to meet delegates working on SiC device development and production.

Silicon carbide devices operate at higher voltages, temperatures and switching frequencies than silicon, and are being adopted across electric vehicles, renewable energy, data centres, aerospace, rail and industrial automation. The processes behind them generate large volumes of test and parametric data, which yieldHUB centralizes and analyses so engineering teams can identify root cause and reach production yield faster.

Among yieldHUB's customers in the sector is Clas-SiC Wafer Fab Ltd, based in Lochgelly, Fife, the world's first dedicated open foundry for silicon carbide power semiconductors, manufacturing 150mm SiC wafers through JBS/MPS diode and MOSFET process flows.

"The speed at which yieldHUB's wafer yield analysis software integrated with our test system's results was remarkable," said Rae Hyndman, Managing Director at Clas-SiC Wafer Fab. "Within a week it was adding significant value and insight from our end-of-line results."

Graeme Morland, Manufacturing Excellence Engineering and Quality Manager at Clas-SiC, described the change in engineering workload: "It used to take us a couple of hours to do something, now it takes us a couple of minutes."

Delegates attending the conference can arrange a meeting with Kevin Robinson in advance, or book a consultation at www.yieldhub.com.

About yieldHUB yieldHUB provides yield management software to semiconductor companies including fabless companies, IDMs, foundries and test houses. With over 20 years in production environments, the platform is used to analyse tens of billions of chips annually.

Media contact Gillian O'Donnell, communications@yieldhub.com www.yieldhub.com

Frequently asked questions

7 and 8 September 2026 at the University of Warwick.

Kevin Robinson, VP Operations, across both days.

No stand number has been assigned. Delegates can arrange a meeting with Kevin Robinson in advance at www.yieldhub.com.

Software that collects test and parametric data from production, centralizes it, and analyses it so engineering teams can find the root cause of yield loss and reach production yield faster.

SiC devices run at higher voltages, temperatures and switching frequencies than silicon. The processes behind them generate large volumes of test and parametric data, and analysing that data is how teams identify root cause and improve yield.

Yes. Customers include Clas-SiC Wafer Fab Ltd in Lochgelly, Fife, the world's first dedicated open foundry for silicon carbide power semiconductors, manufacturing 150mm SiC wafers through JBS/MPS diode and MOSFET process flows.

Semiconductor companies including fabless companies, IDMs, foundries and test houses. The platform has over 20 years in production environments and is used to analyse tens of billions of chips annually.

Contact yieldHUB in advance, meet Kevin at our booth or book a consultation at www.yieldhub.com/contact/

See it on your own data

Book a consultation