Common problems we solve for semiconductor companies in the telecommunications industry

Huge volumes of data

It is common to have >1TB of STDF data needing monitoring and analysis. Scalability built into the yieldHUB database design is key.


yieldHUB supports traceability and fast analysis of returns.


The ability to be alerted of any anomalous behaviour that happened during testing helps prevent customer returns.

Complexity of 5G testing

The ability to augment the test list online with calculated tests allows users to have additional key information on performance.

Test time

yieldHUB treats test time like a test. This means you will be able to analyse it comprehensively to reduce it over time and save cost.

Hidden failure patterns

yieldHUB quickly stacks hundreds of wafers and see the yield at each x/y reveals patterns helping your foundry improve your yield.


If you use fuses on your die to somehow encode lot id, wafer id and x/y then yieldHUB can use this information to make the die searchable in the database. If then there is a customer return, it will be possible to analyse how the die behaved for any tests it underwent in manufacturing.

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Regular automated reports are great for monitoring. But when something does go wrong (e.g. a low yield, or a parametric shift) it is important to know as soon as possible. This is where alerts are key. On the yieldHUB platform, alerts can be set-up in approx 10 seconds.

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Traditionally, characterization typically takes two or three weeks. With yieldHUB Characterize the characterization report should take only an hour or two to generate once testing is complete. This makes a tangible difference in semiconductor NPI where time to market is so important.

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Frequently Asked Questions

Is there a limit on the number of tests you support?

We have customers with 20000 tests in a datalog. We have yet to see an upper limit on how many tests the yieldHUB systems can support.

Do you support test data from modules and systems?

Yes, we have several customers who have data from modules and systems and you can analyse this data in yieldHUB.

Will yieldHUB allow me to see which tests correlate with each other the most? I need to remove some tests to save on test time

Yes, you can generate a Highest Correlations report from any datalog and you will definitely find useful information to reduce your test time. You can also see which tests correlate the most with any given test.

Do you support OTP?

Yes, we support OTP/Fuse ID for traceability.

We are more than happy to be working with yieldHUB for the next five years. Their big data software and worldwide support has allowed us to manage our yields effectively over the years and their solutions have evolved with our needs.
Julie Holland, Vice President, Corporate Operations of Diodes

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