Part Average Test (Pat) Demo

Insights
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Find out how yieldHUB can help companies meet AEC requirements with a demo on our Part Average Test module. 

yieldHUB manages the entire outlier removal process from initial wafer lot characterization to final test yield monitoring.

With it, you will see a huge increase in the quality and reliability of your semiconductors and ICs. Therefore the end product is less likely to stop working before its predicted lifecycle.

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