Part Average Test (Pat) Demo


Find out how yieldHUB help companies meet AEC requirements with a demo on our Part Average Test module. 

Learn how yieldHUB manages the entire outlier removal process from initial wafer lot characterization to final-test yield monitoring.

With it, you will see a huge increase in the quality and reliability of your semiconductors and ICs. Therefore the end product is less likely to stop working before it’s predicted life-cycle.

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