Part Average Test (Pat) Demo
Find out how yieldHUB help companies meet AEC requirements with a demo on our Part Average Test module.
Learn how yieldHUB manages the entire outlier removal process from initial wafer lot characterization to final-test yield monitoring.
With it, you will see a huge increase in the quality and reliability of your semiconductors and ICs. Therefore the end product is less likely to stop working before it’s predicted life-cycle.